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W900 Roughness and Contour Measurement System

ID:W900
With fast measuring axes, W900 measuring systems guarantee short measuring cycles in complex measurement tasks, therefore meeting the most stringent requirements of measurement technology. In conjunction with the Nanoscan probe system, the high-precision traverse unit provides excellent measuring accuracy in combined roughness and contour measurements. W900 measuring systems offer leading quality in roughness, radius, angle and diameter measurements.
    • Fast measurement technology.
    • Excellent measuring accuracy.
    • Traverse unit with interfaces for two probe systems.
    • Innovative complete solution.
    • Highly flexible, dynamic measurement.
    • Extensive automation options.
  • Jenoptik Waveline W800 & W900 
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